New technology to help farmers prevent bacterial wilt in potatoes

The International Potato Center (CIP) in collaboration with the Kenya Plant Health Inspectorate Service (KEPHIS) have validated a new technology to detect bacterial wilt in potatoes. The cost-effective field deployable LAMP (Loop-mediated Isothermal Amplification) assay for the detection of bacteria that causes wilt from stem, leaf, tuber and soil will speed up the seed inspection […]